Infopaket

Methods of control and management of properties of nanoelectronic materials

ОК12

Обов’язкова дисципліна для ОП

Second

2023/2024

2 Semester

6

- Know and understand modern methods of research, organization and planning of experiments, computerized methods of research and processing of measurement results - Know and understand the basic concepts of measurement theory, apply in practice and in computer modeling of objects and phenomena - Be able to formulate and solve problems in the field of metrology related to procedures for observation, measurement, control, diagnosis and forecasting, taking into account the importance of social constraints - Be able to plan and conduct experimental studies of structural, optical and electrophysical properties of organic and inorganic environments - Design and design of optical and optoelectronic devices and systems, devices for spectral research.

Full-time form

1. Know the basics of semiconductor physics, quantum mechanics, the principles of solid state theory. 2. Be able to - measure the spectra of photoluminescence and optical absorption of light in semiconductors, electrophysical parameters of electronics devices, analyze the operation of electronic circuits. 3. Have basic skills in selecting components of electronic circuits of precision devices and optics devices.

"Fundamentals of Nanoelectronics" includes the study of sections: introduction to nanotechnology; energy spectrum of electron carriers in low-dimensional systems; energy spectrum of nanostructures in external fields; transport phenomena in low-dimensional structures, physical bases of electronic and optoelectronic devices with nanostructures, methods of diagnostics and analysis of nanosystems.

Основна: 1. Л.В. Поперенко, В.А. Покропівний. Фізика наноструктур. Київ, 2008. Додаткова: 1. Mark Fox. Optical properties of solids / Oxford University Press, 2001. – 281 p. 2. John H. Davies. The physics of low-dimensional semiconductors. An introduction. – Cambridge university press, 1998. – 425 p. 3. C. Klingshirn. Semiconductor optics. Springer-Verlag Berlin Heidelberg, 2007.

Teaching methods: lectures, weekly control of previous material by answering a specific number of questions, modular test work.

Semester assessment: 1. Modular test 1: 20 points 2. Modular test 2: 20 points Final evaluation in the form of a test: - 60 points. Conditions of admission to the final test: A student is not allowed to take the exam if he / she scored less than 20 points during the semester.

Ukrainian