Infopaket

Electronics materials

ВК 3.2.1

Вибіркова дисципліна для ОП

First

2023/2024

4 Semester

4

- Know and be able to use modern information technology to solve problems in the field of metrology and information and measurement technology - Know and understand the subject area, its history and place in the sustainable development of technology and technology in the general system of knowledge about nature and society - environmental, ethical, economic aspects, requirements of labor protection, industrial sanitation and fire safety in the formation of technical solutions - Know and understand the physical basis of optical phenomena and processes: analyze, interpret, explain and classify optical phenomena, as well as basic physical processes in them - To understand the connection of optics, laser physics and metrology with other natural and engineering sciences, to be familiar with some basic concepts of applied physics, materials science, engineering, as well as with individual objects and natural phenomena that are the subject of other sciences .

Full-time form

1. Know the basics of quantum theory of solids and optical and electron spectroscopy of the surface of condensed matter, the basic concepts of the theory of symmetry of crystals and 2D structures, calculation methods based on Bloch functions of the electronic structure of solids. 2. To be able to analyze the results of measurements of photoluminescence and photoconductivity spectra of heterostructures and nanoobjects, ellipsometric parameters of surface layers of semiconductor and metal thin films and coatings, angular dependences of polarized light reflection coefficient during plasma excitation. 3. Have basic skills in the selection of optoelectronic materials and elements to create units of precision devices and instruments of optics.

"Electronics materials" includes the study of sections: general characteristics of materials for the manufacture of nanostructured elements of optoelectronic systems and methods of their analytical control, surface as an attribute of the interface, atomic-electronic structure of surface layers of materials with different types of conductivity, methods of atomic and electronic structure. thin films, graphene layer with its plasmon response to create sensors when used in optoelectronic devices.

Основна:Л.В. Поперенко, В.С. Стащук. Основи фізики матеріалів оптотехніки. – Київ: ВПЦ «Київський університет», 2011 - 686. Л.В. Поперенко, В.Г. Кравець. Наноматеріали: оптичні, магнітооптичні, магніторезистивні та електронні властивості. – К.: ВПЦ «Київський університет», 2011.- 219 с. О.А. Бурий, С.Б. Убізський. Моделювання та оптимізація твердотільних мікрочипових лазерів.. Львів. Видавнцтво Львівська політехніка. 2013. 200 с. Державна повірочна схема для засобів вимірювання електрорушійної сили та сталої напруги ДЕТУ 08-03-07. Додаткова: 1. В.П. Гаращук. Основи фізики лазерів.: навчальний посібник. Київ. Університетське вид-во Пульсари, 2012. – 344 с. 2. А.С. Андрущак, З.Ю. Готра, О.С. Кушнір. Прикладна електродинаміка інформаційних систем. Львів. Видавнцтво Львівська політехніка. 2012 – 304 с. 3. Оптика металевих структур: монографія /Л.В. Поперенко, Ю.В, Кудрявцев, В.С. Стащук, Янг Пак Лі.- К.: ВПЦ «Київський університет», 2013.- 531 с.

Teaching methods: lectures, practical, independent work, weekly control of previous material by answering a specific number of questions, modular test work.

Semester assessment: 1. Modular test 1: 20 points; 2. Modular test 2: 20 points. Final evaluation in the form of a test: - 60 points.

Ukrainian