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Fundamentals of modern microscopy

ОК 34

Обов’язкова дисципліна для ОП

First

2021/2022

1 Semester

3

- Be able to find sound solutions when compiling structural, functional and schematic diagrams of information and measuring equipment - Be able to organize the procedure of measurement, calibration, testing in a group or separately - Have basic skills of theoretical and / or experimental research in optics, laser physics and optoelectronics, performed individually (autonomously) and / or as part of a research group.

Full-time form

1. To know the defining features of nanoscale materials, basics of metrology of nanostructures, basic electrical and optical phenomena, statistics of electrons and holes and kinetic phenomena in nanostructures, general provisions of the theory of solids. 2. Be able to measure optical and electrophysical parameters and characteristics of photonics materials, analyze the work of modern microscopes. 3. Have basic skills in analyzing the work of modern microscopes.

The discipline "Fundamentals of Modern Microscopy" is devoted to the study of the principles of operation of the atomic force microscope, the physics of the processes underlying the tunnel and confocal microscopes. The structure and main characteristics of atomic force, tunnel and fluorescent confocal microscopes are considered. The curriculum consists of two content modules: Within the framework of the first content module, the following issues are considered at the lectures: introduction to nanotechnologies; energy spectrum of electron carriers in low-dimensional systems; the principle of operation of the atomic force microscope; transport phenomena in low-dimensional structures. Within the framework of the second content module, the following issues are considered at the lectures: physical bases of tunnel microscope operation; methods of diagnostics and analysis of nanosystems by tunnel and confocal fluorescence microscopy; modern directions of diagnostics of nanostructures.

Основна: 1. John H. Davies. The physics of low-dimensional semiconductors. An introduction. – Cambridge university press, 1998. – 425 p. 2. C. Klingshirn. Semiconductor optics. Springer-Verlag Berlin Heidelberg, 2007.

Teaching and learning methods: lectures, weekly control of previous material by answering a specific number of questions.

Semester assessment: 1. Modular test 1: 20 points 2. Modular test 2: 20 points Final evaluation in the form of a test: - 60 points.

Ukrainian