Fluctuations in electronics

Course: Applied Physics and Nanomaterials

Structural unit: Faculty of Radiophysics, Electronics and Computer Systems

Title
Fluctuations in electronics
Code
РК.7.02, ВК.4.07
Module type
Вибіркова дисципліна для ОП
Educational cycle
Short
Year of study when the component is delivered
2023/2024
Semester/trimester when the component is delivered
3 Semester
Number of ECTS credits allocated
4
Learning outcomes
Student should know: The current level of science about electrical fluctuations. Types of electrical fluctuations. Theoretical foundations of fluctuation phenomena in semiconductors. Methods and peculiarities of calculating fluctuation characteristics. Methods of noise measurement. Methods of noise spectroscopy. Student should be able to: Build communication competently. Demonstrate an understanding of personal responsibility for professional decisions based on the use of physical methods.
Form of study
Distance form
Prerequisites and co-requisites
The educational discipline "Fluctuations in Electronics" is based on the cycle of disciplines of professional and practical training, in particular, general physics: "Electricity", "Atomic Physics", as well as "Quantum Mechanics", "Electrodynamics", "Quantum and Semiconductor Electronics".
Course content
Basic (fundamental) and redundant types of noise. Spectral and correlation representation of noise. Spectral density of fluctuations. Discrete Fourier transform. Noise sources of semiconductor diode and bipolar transistor. Thermal noise. Fractional noise. Generation-recombination noise. Noise in the volume charge region. Flicker noise. Surface and volume noise: nature and differences. Noise spectroscopy of a defective semiconductor structure. Features of the noise of quantum systems. Noise in nanostructures.
Recommended or required reading and other learning resources/tools
Main sources:: 1. N. Lukyanchikova. Noise Research in Semiconductor Physics. Taylor & Francis Ltd; 1st edition. 2. Aldert van der Ziel, Noise in Measurements. John Wiley & Sons (January 1, 1976). Additional literature: 3. Noise: Sources, Characterization, Measurement (Prentice-Hall information and system sciences series) 4. Noise in Solid State Devices and Circuits [Japanese Edition] Published by Wiley-Interscience, 1970
Planned learning activities and teaching methods
Submission of abstracts Protection of essays Scoring/additional test work and/or completion of homework Test
Assessment methods and criteria
ZM 1 Test Final assessment Minimum 25 35 60 Maximum 50 50 100
Language of instruction

Lecturers

This discipline is taught by the following teachers

Mykhailo Vassylovych Petrychuk
Department of Electrophysics
Faculty of Radiophysics, Electronics and Computer Systems

Departments

The following departments are involved in teaching the above discipline

Department of Electrophysics
Faculty of Radiophysics, Electronics and Computer Systems