Modern methods of surface diagnostics

Course: Radio Physics and Electronics

Structural unit: Faculty of Radiophysics, Electronics and Computer Systems

Title
Modern methods of surface diagnostics
Code
ВК 01.1
Module type
Вибіркова дисципліна для ОП
Educational cycle
Second
Year of study when the component is delivered
2023/2024
Semester/trimester when the component is delivered
2 Semester
Number of ECTS credits allocated
3
Learning outcomes
The student should know: Diffraction and scattering of electrons of low energies on the surfaces of solid bodies (general physical principles). Surface diagnostics with low-energy electrons - diffraction and microscopy. Physics of the interaction of neutral atoms and molecules with the surfaces of solid bodies. Growth processes of thin and nano-sized films, nano- and micro-structuring of the surface. Atomic force microscopy and spectroscopy of solid surface. Processes of interaction of the surface of a solid body with electromagnetic radiation. Photoelectron spectroscopy of the surface of a solid body. Processes of interaction of ions with the surface of a solid body. Ion sputtering, technological applications. Interaction of the surface of a solid body with an external electric field. Particle emission and radiation from the surface of a solid (formal classification, basic physical parameters).
Form of study
Full-time form
Prerequisites and co-requisites
It is necessary to prepare according to the undergraduate program of physical specialties of the university in the following disciplines: general physics, quantum mechanics, physics of condensed matter.
Course content
Physical principles and experimental technique of scanning tunneling microscopy. Auger effect and system of spectroscopic designations of Auger transitions. X-ray photoelectron spectroscopy of a solid surface. Atomic force microscopy in non-contact mode. Experimental implementation of electronic Auger spectroscopy of the surface of a solid body. Scanning tunneling spectroscopy in elastic and inelastic modes. Physical basis of surface sensitivity of photoelectron and Auger spectroscopy methods. Atomic force microscopy in contact mode. Description of electron tunneling in the first order of perturbation theory. Principles of quantitative determination of the elemental composition of the surface using electron spectroscopy techniques.
Recommended or required reading and other learning resources/tools
1. Hans Luth, Solid Surfaces, Interfaces and Thin Films, Springer 2010. 2. Harald Ibach, Physics of Surfaces and Interfaces, Springer 2006. 3. T.L. Alford, L.C. Feldman, J.W. Mayer, Fundamentals of Nanoscale Film Analysis, Springer 2007. 4. J.A. Venables, Introduction to Surface and Thin Film Processes, Cambridge University Press 2003. 5. Feliciano Giustino, Materials Modelling using Density Functional Theory, Oxford University Press 2014. 6. D. S. Sholl, J. A. Steckel, Density Functional Theory, Wiley 2009. 7. K. W. Kolasinski, Surface Science, Wiley 2008. 8. M. Feldman (ed.) Nanolithography, Woodhead Publishing Ltd 2014.
Planned learning activities and teaching methods
Lectures, practical classes, consultations, independent work.
Assessment methods and criteria
Semester assessment: The study semester has three meaningful modules. After the completion of lectures #4, #8 and #12, written modular tests are conducted. Mandatory for admission to the exam is: writing modular test papers with a score of at least 12. Final evaluation (in the form of credit): the form of the exam is written and oral. The exam ticket consists of 2 questions, each question is worth 20 points. In total, you can get from 0 to 40 points for the exam. A condition for achieving a positive grade for a discipline is obtaining at least 60 points, the grade for the exam cannot be less than 24 points. Conditions for admission to the final credit: the condition for admission to the exam is that the graduate student must obtain a total of no less than the critical-calculated minimum for the semester. Students who, during the semester, scored less points than the critical-calculated minimum of 36 points, must write an additional test paper in order to be admitted to the exam.
Language of instruction
Ukrainian

Lecturers

This discipline is taught by the following teachers

Sergey Petrovich Kulyk
Department of Quantum Radio Physics and Nanoelectronics
Faculty of Radiophysics, Electronics and Computer Systems

Departments

The following departments are involved in teaching the above discipline

Department of Quantum Radio Physics and Nanoelectronics
Faculty of Radiophysics, Electronics and Computer Systems